Journal of Applied Science and Engineering

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K. Dharmalingam This email address is being protected from spambots. You need JavaScript enabled to view it.1, K. Ramachandran2 , P. Sivagurunathan3 , B. Prabhakar Undre4 , P. W. Khirade4 and S. C. Mehrotra5

1Department of Physics, School of Science and Humanities, Karunya University, Karunya Nagar, Coimbatore-641 114, Tamilnadu, India
2Department of Physics, SRM University, Kattankulathur-603 203, Tamilnadu, India
3Department of Physics, Annamalai University, Annamalai Nagar-608 002, Tamilnadu, India
4Microwave Research Laboratory, Department of Physics, Dr. B. A. M. University, Aurangabad - 431 004, Maharashtra, India
5Department of Computer Science and Information Technology, Dr. B. A. M. University, Aurangabad - 431 004, Maharashtra, India


 

Received: May 1, 2006
Accepted: March 12, 2007
Publication Date: June 1, 2009

Download Citation: ||https://doi.org/10.6180/jase.2009.12.2.03  


ABSTRACT


A dielectric relaxation study on alcohols-ethyl methacrylate binary mixtures has been carried out at different concentrations and temperatures using Time Domain Reflectometry (TDR). The Least Squares fit method has been used to obtain the dielectric parameters (the static dielectric constant ε0 and relaxation time τ). By using these parameters, the Bruggeman factor, the Kirkwood correlation factor and excess inverse relaxation time were determined and discussed to yield information on the molecular structure and dynamics of the mixture. The ε0 and τ values decreased with an increase in the % of ethyl methacrylate in alcohols for all the systems. The value of the τ increased with an increase in chain-length of the alcohols whereas the reverse trend is observed for ε0.


Keywords: Dielectric Relaxation, Time Domain Reflectometry, Alcohols


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